Trace

Description

Picks items based on condition that they can be traced with a ray from given object.

On top of common parameters that are listed above this test following parameters.

Parameters

Name	Description
Trace To	Object that needs to be traced to
Up Offset	Vertical offset of tracing rays
Culling Layer	Layermask of layers that are "visible" for tracing

Example

In the picture below trace test is used to score items based on their visibility from querier position.

To achieve this effect set Test Purpose to "Score Only". Set Score Sampling Operation to "Multiply", set Filter Type to "Maximum" and then set Max Value to any non-negative value (in example it's zero). Then set Trace To to "Querier".

For more information about querier visit EQS Tester tab.